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检测大口径光学平面镜时干涉条纹的子孔径拼接方法
杨晓洪; 高必烈; 崔向群
2005-07
Source Publication光学技术
Volume31Issue:4Pages:611-613
Abstract
提出了用Ritchey-Common 法检测大口径光学平面镜时干涉条纹的子孔径拼接方法。通过确立基准点将多幅子孔径检测数据统一到全口径归一化坐标系下进行拼接,解决了在检验光路中因Ritchey 角所引起的投影变形问题和如何消去因被检平面的大曲率所造成的像散。通过Zernike 多项式拟合重建连续波面,可恢复全口径波面图像。
Keyword干涉条纹的子孔径拼接 Ritchey-common 检测 Zernike 多项式
Subject Area天文镜面(材料、加工、检测)
Document Type期刊论文
Identifierhttp://ir.niaot.ac.cn/handle/114a32/401
Collection期刊论文
Recommended Citation
GB/T 7714
杨晓洪,高必烈,崔向群. 检测大口径光学平面镜时干涉条纹的子孔径拼接方法[J]. 光学技术,2005,31(4):611-613.
APA 杨晓洪,高必烈,&崔向群.(2005).检测大口径光学平面镜时干涉条纹的子孔径拼接方法.光学技术,31(4),611-613.
MLA 杨晓洪,et al."检测大口径光学平面镜时干涉条纹的子孔径拼接方法".光学技术 31.4(2005):611-613.
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