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Quantum interaction-free measurement
DONG Zhi-Chuan; ZHUANG Peng
2006-05-19
会议录名称Adv. Optical Manufac. and Testing Tech.: Optical Test and Measurement Tech. and Equip
卷号6150
期号6150
页码Vol.6150 2U-1-8
会议日期2005-11-2
会议地点Xian, China
会议主办者The International Society for Optical Engineering
出版者SPIE
摘要
“Interaction-free measurements” (IFM) originate from the latest quantum interferometric technologies. The latest research of quantum optics demonstrates, by using the complementary wavelike and particlelike natures of photons, it is possible to make interaction-free measurements by which the presence of an object can be determined with no photons being absorbed. The paper introduces the concept of “Interaction-free Measurement” (IFM), the original Elitzur-Vaidman scheme, the “High Efficiency Interaction-free Measurement”, the application of quantum Zeno effect and the improved scheme proposed by Kwiat et al. The EV scheme is implemented in a Mach–Zehnder interferometer. Theoretically this paper also draws a conclusion in IFM feasibility by analyzing the wave functions of photon at various locations in the interferometer.
关键词Interaction-free Measurements (Ifm) Quantum Zeno Effect Quantum Interferometric Technologies Mach–zehnder Interferometer
学科领域天文技术与方法
文献类型会议论文
条目标识符http://ir.niaot.ac.cn/handle/114a32/450
专题会议论文
推荐引用方式
GB/T 7714
DONG Zhi-Chuan,ZHUANG Peng. Quantum interaction-free measurement[C]:SPIE,2006:Vol.6150 2U-1-8.
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